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Benchtop EDXRF Spectrometer: Fast & Non-destructive Elemental Analysis(FP Method)

Mar 11 , 2026

 

This video introduces the benchtop XRF analyzer with FP method (Fundamental Parameter) for standardless quantitative analysis.

No standard sample needed

Non-destructive testing

Full-scan elemental analysis

Element range: F(9) – U(92)

Fast analysis: ~15 min per sample

Ideal for new materials, industrial waste, metal analysis and RoHS compliance.

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