Benchtop EDXRF Spectrometer: Fast & Non-destructive Elemental Analysis(FP Method)
Mar 11 , 2026
This video introduces the benchtop XRF analyzer with FP method (Fundamental Parameter) for standardless quantitative analysis.
No standard sample needed
Non-destructive testing
Full-scan elemental analysis
Element range: F(9) – U(92)
Fast analysis: ~15 min per sample
Ideal for new materials, industrial waste, metal analysis and RoHS compliance.