Simultaneous ICP-OES for elemental analysis of liquids
Wavelength range:195-800nm
For 70 trace elements and macroelements
Analyze up to 600 samples per day
Low operating costs
Intuitive operation
Ultra-low limits of detection
Ultra-high speed of measurement
Simultaneous ICP-OES for elemental analysis of liquids
Wavelength range:195-800nm
For 70 trace elements and macroelements
Analyze up to 600 samples per day
Low operating costs
Intuitive operation
Ultra-low limits of detection
Ultra-high speed of measurement
TY-9900 Inductively Coupled Plasma Atomic Emission Spectrometer (ICP-AES)
Wavelength range:195-800nm
For 70 trace elements and macroelements
Analyze up to 600 samples per day
Low operating costs
Intuitive operation
Ultra-low limits of detection
Ultra-high speed of measurement
Simultaneous ICP-OES for elemental analysis of liquids
Wavelength range:195-800nm
For 70 trace elements and macroelements
Analyze up to 600 samples per day
Low operating costs
Intuitive operation
Ultra-low limits of detection
Ultra-high speed of measurement
Simultaneous ICP-OES for elemental analysis of liquids
Wavelength range:195-800nm
For 70 trace elements and macroelements
Analyze up to 600 samples per day
Low operating costs
Intuitive operation
Ultra-low limits of detection
Ultra-high speed of measurement
Simultaneous ICP-OES for elemental analysis of liquids
Wavelength range:195-800nm
For 70 trace elements and macroelements
Analyze up to 600 samples per day
Low operating costs
Intuitive operation
Ultra-low limits of detection
Ultra-high speed of measurement
Simultaneous ICP-OES for elemental analysis of liquids
Wavelength range:195-800nm
For 70 trace elements and macroelements
Analyze up to 600 samples per day
Low operating costs
Intuitive operation
Ultra-low limits of detection
Ultra-high speed of measurement
Simultaneous ICP-OES for elemental analysis of liquids
Wavelength range:195-800nm
For 70 trace elements and macroelements
Analyze up to 600 samples per day
Low operating costs
Intuitive operation
Ultra-low limits of detection
Ultra-high speed of measurement