CMOS-based, spark discharge, metal detection
Ultra-low limits of detection
High integration, reliability, stability
Energy saving 50%, material saving
Lowing operating cost
Small size, light weight, easy to move and install
Mobile APP control
Standardized parameter modification
High resolution CMOS readout system
Low total cost of ownership
Vacuum optics enabling fast stabilization
Unmatched analytical performance and reliability
Excellent long-term stability
Intelligent design, Modular design
Ferrous and non-ferrous applications
Easy to use with full PC control
Friendly user interface
High resolution CMOS readout system
Low total cost of ownership
Vacuum optics enabling fast stabilization
Unmatched analytical performance and reliability
Excellent long-term stability
Intelligent design, Modular design
Ferrous and non-ferrous applications
Easy to use with full PC control
Friendly user interface
CMOS -based, spark discharge, metal detection
Ultra-low limits of detection
High integration, reliability, stability
Energy saving 50%, material saving
Lowing operating cost
Small size, light weight, easy to move and install
Multi-substrate upgrade easy, without changes to increase the hardware
Mobile APP controlStandardized parameter modification
Accurate, Fast, Non-Destructive, Straightforward, Environmentally Protective
For the elements in the range of Na-U
Halogen-free testing, ROHS/ELV testing
Coating thickness measurement
Identification of jewelry, precious stones, precious metals
Master the unknown material
Outstanding sensitivity leads to up to a factor 3 improved precision
Low measurement cost, easy to operate
